Methods Of Etching Films Comprising Transition Metals

ABSTRACT

Provided are methods for etching films comprising transition metals. Certain methods involve activating a substrate surface comprising at least one transition metal, wherein activation of the substrate surface comprises exposing the substrate surface to heat, a plasma, an oxidizing environment, or a halide transfer agent to provide an activated substrate surface; and exposing the activated substrate surface to a reagent comprising a Lewis base or pi acid to provide a vapor phase coordination complex comprising one or more atoms of the transition metal coordinated to one or more ligands from the reagent. Certain other methods provide selective etching from a multi-layer substrate comprising two or more of a layer of Co, a layer of Cu and a layer of Ni.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims priority to U.S. Provisional Application Nos.61/779,583, filed Mar. 13, 2013 and 61/892,186, filed Oct. 17, 2013, theentire contents of both of which are herein incorporated by reference intheir entirety.

TECHNICAL FIELD

Aspects of the present invention relates generally to methods of etchingfilms. In particular, aspects of the invention relates to etching filmscomprising transition metals for semiconductor devices.

BACKGROUND

Deposition of films on a substrate surface is an important process in avariety of industries including semiconductor processing, diffusionbarrier coatings and dielectrics for magnetic read/write heads. Chemicalvapor deposition (CVD) and atomic layer deposition (ALD) are twodeposition processes used to form or deposit various materials on asubstrate. In general, CVD and ALD processes involve the delivery ofgaseous reactants to the substrate surface where a chemical reactiontakes place under temperature and pressure conditions favorable to thethermodynamics of the reaction. However, a common problem with one ormore these deposition processes is the unwanted deposition ontodeposition chamber walls, showerhead, etc. For example, if cobalt filmsare deposited, there is a possibility for the buildup of undesiredcobalt metal or compounds (e.g., carbidic cobalt) on the walls of thechamber. It then becomes necessary to remove this buildup. There is thusa need for methods of cleaning such buildup from deposition equipment.In particular, it would be particularly advantageous to haveself-limiting etch methods, which would yield greater control duringetch.

Additionally, in the semiconductor industry, miniaturization requiresatomic level control of thin film deposition to produce conformalcoatings on high aspect structures. One method for deposition of thinfilms with control and conformal deposition is atomic layer deposition(ALD), which employs sequential, surface reactions to form layers ofprecise thickness. Most ALD processes are based on binary reactionsequences which deposit a binary compound film. Because the surfacereactions are sequential, the two gas phase reactants are not incontact, and possible gas phase reactions that may form and depositparticles are limited. However, before the present invention, there hasnot been a commercially viable way to delicately etch films with controland conformality. For example, while there have been wet etch methodsproposed for cobalt, there is still a need for dry methods to removecobalt and/or cobalt residue, and preferably in situ methods that areself-limiting and allow for precise control over etch rate. Even moreparticularly, a method that is selective for a particular metal isdesired, as it would provide even more control over the etching process.

SUMMARY

One aspect of the invention pertains to a method of etching a substrate.the method comprises activating a substrate surface comprising at leastone transition metal, wherein activation of the substrate surfacecomprises exposing the substrate surface to heat, a plasma, an oxidizingenvironment, or a halide transfer agent to provide an activatedsubstrate surface; and exposing the activated substrate surface to areagent comprising a Lewis base or pi acid to provide a vapor phasecoordination complex comprising one or more atoms of the transitionmetal coordinated to one or more ligands from the reagent.

In one or more embodiments, the Lewis base or pi acid comprises CO, PR¹₃, wherein each R¹ is independently a C1-C6 alkyl group,1,2-bis(difluorophosphino)ethane, N₂O, NO, NH₃, NR² ₃, wherein each R²is independently hydrogen C1-C6 branched or unbranched, substituted orunsubstituted, alkyl, allyl or cyclic hydrocarbon or heteroatomic group,or a compound having the structure:

wherein each R^(b) is independently hydrogen, R or C1-C4 alkyl. In someembodiments, the pi acid comprises AlH_(n)X_(m)R^(c) _(p), wherein X isa halogen, the sum of n+m+p is 3, and R^(c) is C1-C6 alkyl. In one ormore embodiments, activation of the substrate surface provides a surfacetermination which will react with a Lewis acid and/or pi acid. In someembodiments, the Lewis base or pi acid comprises a chelating amineselected from the group consisting of N,N,N′,N′-tetramethylethylenediamine, ethylene diamine, N,N′-dimethylethylenediamine,2-(aminomethyl)pyridine, 2-[(alkylamino)methyl]pyridine, and2-[(dialkylamino)methyl]pyridine, wherein the alkyl group is C1-C6alkyl.

The activation of the substrate surface can take several forms. In oneor more embodiments, activation of the substrate surface comprisesexposing the substrate surface to heat. In some embodiments, exposure ofthe substrate surface to heat and the reagent occur simultaneously orsubstantially simultaneously.

In one or more embodiments, activation of the substrate surfacecomprises exposing the substrate surface to a plasma. In someembodiments, exposure of the substrate surface to the plasma and thereagent occur simultaneously or substantially simultaneously. In furtherembodiments, the plasma comprises H₂, NO, N₂O, NF₃, Cl₂, Ar or N₂. Inone or more embodiments, the plasma comprises N₂O, and exposure of thesubstrate surface to the N₂O results in a —NO surface termination.

In some embodiments, activation of the substrate surface comprisesexposure to a halide transfer agent. In further embodiments, the halidetransfer agent comprises I₂, Br₂, Cl₂, a trialkylsilyl halide or analkyl halide, wherein the alkyl group may be C1-C6 alkyl.

In one or more embodiments, activation of the substrate surfacecomprises exposure of the substrate surface to an oxidizing environment.In further embodiments, exposure of the substrate surface to anoxidizing environment comprises exposing the substrate surface to O₂,O₃, N₂O, NO, Br₂, F₂, I₂ or Cl₂.

In some embodiments, the transition metal comprises an element selectedfrom the group consisting of Co, Cu, Ru, Ni, Fe, Pt, Mn and Pd. In oneor more embodiments, the substrate surface comprises about 90 to about100% transition metal and 0 to about 10% carbon.

There are also other variants of the method. In one or more embodiments,the substrate surface overlies a deposition chamber wall or showerhead.In some embodiments, the method further comprises purging the vaporphase coordination complex.

A second aspect of the invention pertains to a method of etching amulti-layer substrate. The method comprises providing a multi-layersubstrate comprising two or more of a layer of Co, a layer of Cu and alayer of Ni; activating a surface of the layer of Co, layer of Cu orlayer of Ni, wherein activation of the substrate surface comprisesexposing the substrate surface to heat, a plasma or a halide transferagent to provide an activated substrate surface; and exposing theactivated substrate surface to a chelating amine at a first temperaturesuch that the chelating amine will only form a volatile metalcoordination complex with one of Co, Cu or Ni at the first temperature.

In one or more embodiments, the method further comprises exposing theactivated substrate surface to a chelating amine at a secondtemperature, such that the chelating amine will only form a volatilemetal coordination complex with one of Co, Cu or Ni at the secondtemperature. In some embodiments, the chelating amine has a structurerepresented by:

wherein each R^(a) is independently hydrogen or C1-C4 alkyl, with theproviso that not all of the R^(a) groups are hydrogen. In someembodiments, the chelating amine is selected from the group consistingof N,N,N′,N′-tetramethylethylene diamine andN,N′-dimethylethylenediamine. In one or more embodiments, the methodfurther comprises purging the coordination complex.

A third aspect of the invention pertains to a method of etching asubstrate, the method comprising: activating a substrate surfacecomprising cobalt or copper, wherein activation of the substrate surfacecomprises exposing the substrate surface to Br₂ to provide an activatedsubstrate surface; and exposing the activated substrate surface to areagent comprising TMEDA to provide a vapor phase coordination complexcomprising one or more atoms of the cobalt or copper coordinated to oneor more ligands from the reagent.

BRIEF DESCRIPTION OF THE DRAWINGS

So that the manner in which the above recited features of the presentinvention can be understood in detail, a more particular description ofthe invention, briefly summarized above, may be had by reference toembodiments, some of which are illustrated in the appended drawings. Itis to be noted, however, that the appended drawings illustrate onlytypical embodiments of this invention and are therefore not to beconsidered limiting of its scope, for the invention may admit to otherequally effective embodiments.

FIG. 1 shows a schematic of a method in accordance with one or moreembodiments of the invention;

FIG. 2 shows a schematic of a method in accordance with one or moreembodiments of the invention;

FIG. 3 shows a schematic of a method in accordance with one or moreembodiments of the invention;

FIG. 4 shows a schematic of a method in accordance with one or moreembodiments of the invention;

FIG. 5 shows a schematic of a method in accordance with one or moreembodiments of the invention;

FIG. 6 shows a graph of amount of cobalt etched as a function of cyclesfor a process in accordance with one or more embodiments of theinvention;

FIG. 7 shows a schematic of a method in accordance with one or moreembodiments of the invention;

FIG. 8 shows a graph of the amount of cobalt etched as a function oftemperature for a process in accordance with one or more embodiments ofthe invention;

FIG. 9 shows a graph of the amount of cobalt etched as a function oftemperature for a process in accordance with one or more embodiments ofthe invention; and

FIG. 10 shows a schematic of a method in accordance with one or moreembodiments of the invention.

DETAILED DESCRIPTION

Before describing several exemplary embodiments of the invention, it isto be understood that the invention is not limited to the details ofconstruction or process steps set forth in the following description.The invention is capable of other embodiments and of being practiced orbeing carried out in various ways. It is also to be understood that thecomplexes and ligands of the present invention may be illustrated hereinusing structural formulas which have a particular stereochemistry. Theseillustrations are intended as examples only and are not to be construedas limiting the disclosed structure to any particular stereochemistry.Rather, the illustrated structures are intended to encompass all suchcomplexes and ligands having the indicated chemical formula.

It has been discovered that certain combinations of activation methodsand reagents allow for the etching of substrates comprising at least onetransition metal. Possible methods for the activation of a substratesurface include exposing the substrate surface to heat, a plasma, anoxidizing environment, or a halide transfer agent. Reagents includeLewis bases and/or pi acids. These processes allow for the formation ofvolatile metal coordination complexes of the substrate metal, which canthen be flowed away or purged from the substrate surface, therebyremoving some of the substrate. Certain processes relate to selectivemetal etching, which allow for removal of one transition metal, whileleaving another intact.

Accordingly, one aspect of the invention pertains to a method of etchinga substrate. The method comprises activating a substrate surfacecomprising at least one transition metal. Activation of the substratesurface comprises exposing the substrate surface to heat, a plasma, anoxidizing environment, or a halide transfer agent to provide anactivated substrate surface; and exposing the activated substratesurface to a reagent comprising a Lewis base or pi acid to provide avapor phase coordination complex comprising one or more atoms of thetransition metal coordinated to one or more ligands from the reagent.

A “substrate” as used herein broadly covers substrates comprising one ormore transition metals. In some embodiments, the term includes equipmentthat has a layer of buildup deposited thereon. As described above, acommon problem with one or more of these deposition processes is theunwanted deposition onto deposition chamber walls, showerhead, etc.Thus, in some embodiments, the substrate comprises deposited metaloverlying a deposition chamber wall, a deposition showerhead, etc. Inone or more embodiments, the term refers to any substrate or materialsurface comprising a transition metal that is formed on a secondsubstrate upon which film processing is performed during a fabricationprocess. Substrates may be exposed to a pretreatment process to polish,etch, reduce, oxidize, hydroxylate, anneal and/or bake the substratesurface. The term “substrate surface” refers to an exposed surface ofthe substrate. In one or more embodiments, and as the context dictates,as layers are added to the substrate or (in the alternative) part of thesubstrate is removed, the newly exposed surface becomes the substratesurface.

In one or more embodiments, the substrate surface comprises at least onetransition metal. In one or more embodiments, the transition metalcomprises a first row transition metal. In some embodiments, thetransition metal is selected from the group consisting of Co, Cu, Ru,Ni, Fe, Pt, Mn and Pd. In some embodiments, the substrate surfaceconsists essentially of the transition metal. In one or moreembodiments, the substrate surface may comprise more than one transitionmetal, including metal alloys. An example of such a substrate includes asubstrate comprising both cobalt and iron.

In other embodiments, the substrate surface comprises at least onetransition metal, but also comprises other components. Other componentsmay include carbon. In one or more embodiments, the substrate surfacecomprises about 90 to about 100% transition metal and 0 to about 10%carbon. Carbide films may be especially seen in embodiments relating tothe removal of transition metal carbides deposited onto depositionchamber walls, showerheads, and other equipment components. In someembodiments, the other components may include oxygen, boron, sulfurand/or nitrogen. Therefore, other examples of suitable substratecomprise materials include metal alloys/intermetallics, metal oxides,metal borides, metal sulfides, metal nitrides, metal intermetallicborides, metal intermetallic oxides, metal intermetallic sulfides andmetal intermetallic nitrides. To be clear, the above encompassessubstrate comprising more than one transition metal as well asadditional components. An example of such a material is a substratecomprising cobalt, iron and boron (CoFeB).

Once the surface has been activated and a reagent gas has been flowedover the reactive surface, it is thought that the reagent gas forms ametal coordination complex with one or more of the transition metalatoms from the substrate surface. Ideally, the reaction conditions arechosen so that the formed coordination complex is volatile at a giventemperature (i.e., in the vapor phase). Then, the complex may simply beflowed away from the substrate surface and, as appropriate, out of thechamber. That is, in some embodiments, the method further comprisespurging the vapor phase coordination complex.

The substrate surface will therefore be at least one metal layer thinnerthan before the etch process. In some embodiments, the etch process isself-limiting. That is, each time an etch cycle is performed, the sameamount of the substrate is removed, although not necessarily at themonolayer. For example, a certain number of Angstroms (e.g., about 7),or several monolayers may be removed per cycle. In these embodiments,one or more layers of transition metal atoms may be reliably removedeach cycle. Such a method may be referred to as “alternating exposureetching,” where the substrate surface is sequentially or substantiallysequentially exposed to reagent and activation agents. As used herein“substantially sequentially” means that the majority of the duration ofthe pulses does not overlap with the pulse of co-reagent, although theremay be some overlap. In other embodiments, the process may beself-limiting at the monolayer. That is, in such embodiments, only onelayer of transition metal atoms is removed at a time. Such a process maybe referred to as “atomic layer etching.”

The specific reaction conditions for the etch reactions may be selectedbased on the properties of the reagents and substrate surface, as wellas the pressure used. The etch may be carried out at atmosphericpressure, but may also be carried out at reduced pressure. The substratetemperature should be high enough to keep the formed metal complexes inthe gaseous phase and to provide sufficient energy for surfacereactions. The properties of the specific substrate, film precursors,etc. may be evaluated using methods known in the art, allowing selectionof appropriate temperature and pressure for the reaction.

In some embodiments, the substrate surface temperature is kept belowabout 500, 475, 450, 425, 400, 375, 350, 325, or 300° C. In embodimentswhere the etch is utilized for cleaning buildup off of equipment, thesubstrate temperature may be kept below 250, 225, or 200° C. Thesubstrate surface temperature should be at least about room temperature(23° C.) or at least about 25, 50 or 75° C.

Reagents

In accordance with one or more embodiments of the invention, thereagents comprise a Lewis base or pi acid. A “pi acid,” as used herein,refers to a compound that, as a ligand, can accept electron density froma metal into empty pi orbitals as well as donate electron density to themetal via a sigma bond. A “Lewis base,” as used herein, refers to acompound that, as a ligand, can donate an electron pair to a metal.There are several suitable reagents for the processes described herein.

In one or more embodiments, the Lewis base or pi acid comprises achelating amine. In some embodiments, the chelating amine has astructure represented by:

wherein each R^(a) is independently hydrogen or C1-C4 alkyl group withthe proviso that not all of the R^(a) groups are hydrogen. In furtherembodiments, the chelating amine is selected from the group consistingof N,N,N′,N′-tetramethylethylene diamine (also known as TMEDA), ethylenediamine, N,N′-dimethylethylenediamine, 2-(aminomethyl)pyridine,2-[(alkylamino)methyl]pyridine, and 2-[(dialkylamino)methyl]pyridine,wherein the alkyl group is a C1-C6 alkyl group.

In some embodiments, the Lewis base or pi acid comprises CO,alkylphosphines (PR¹ ₃, wherein each R¹ is a C1-C6 alkyl group),1,2-bis(difluorophosphino)ethane, N₂O, NO, NH₃, NR² ₃, wherein each R²is independently hydrogen or C1-C6 branched or unbranched, substitutedor unsubstituted, alkyl, allyl or cyclic hydrocarbon or heteroatomicgroup, or a compound having the structure:

wherein each R^(b) is independently hydrogen, R or C1-C4 alkyl. It isnoted that N₂O is not a traditional Lewis base, but does have a loneelectron pair. In some embodiments, wherein the reagent comprises NR² ₃,each R² is independently C1-C6 alkyl. In other embodiments, at least oneof the R² groups is cyclohexylamine.

In one or more embodiments, the pi acid comprises an aluminum precursor.In further embodiments, the aluminum precursor has formulaAlH_(n)X_(m)R^(c) _(p), wherein X is a halogen, the sum of n+m+p is 3,and R^(c) is C1-C6 alkyl.

Activation

In one or more embodiments, the process includes activation of thesubstrate surface. In some embodiments, activation of the substratesurface provides a surface termination which will react with a Lewisacid and/or pi acid. In further embodiments, the surface terminationwill react with any one or more of the Lewis acids and/or pi acids.

In some embodiments, activation of the substrate surface is accomplishedby heating the substrate surface. Heating the substrate surface can becarried out by methods known in the art, including simply heating thechamber. In some embodiments, the substrate surface temperature is keptbelow about 400, 375, 350, 325, or 300° C. In embodiments where the etchis utilized for cleaning buildup off of equipment, the substratetemperature may be kept below 250, 225, or 200° C. The substrate surfacetemperature should be at least about room temperature (23° C.) or atleast about 25, 50 or 75° C.

With processes that include heating, a reagent gas may be passed overthe heated substrate. The substrate surface may be heated and exposed tothe reagent gas simultaneously or substantially simultaneously. As usedherein, the phrase “exposure of the substrate surface to heat and thereagent occur substantially simultaneously” means that the substratesurface is heated with a majority of the heating duration overlappingwith exposure to the reagent, although they might not be completelyco-extensive. In some embodiments, the reagent gas utilized afterheating the substrate comprises one or more of CO, PR¹ ₃, N₂O, NO, NH₃,NR² ₃, wherein each R¹ is a C1-C6 alkyl group and each R² is C1-C6branched or unbranched, substituted or unsubstituted, alkyl, allyl orcyclic hydrocarbon or heteroatomic group. In other embodiments, thereagent gas comprises a chelating amine, such asN,N,N′N′-tetramethylethylene diamine and N,N′-dimethylethylenediamine.

In some embodiments, activation of the substrate surface comprisesexposing the substrate surface to a plasma. The substrate surface may beexposed to the plasma and the reagent gas sequentially, substantiallysequentially, simultaneously or substantially simultaneously. As usedherein, the phrase “exposure of the substrate surface to the plasma andthe reagent occur substantially sequentially” means that the substratesurface is exposed to the plasma with a majority of the plasma exposureduration not coinciding with exposure to the reagent, although there maybe some overlap. As used herein, the phrase “exposure of the substratesurface to the plasma and the reagent occur substantiallysimultaneously” means that the substrate surface is exposed to theplasma with a majority of the plasma exposure duration overlapping withexposure to the reagent, although they might not be completelyco-extensive.

Generally, a plasma used for activation should enhance the reactivity ofthe surface toward subsequent reagent exposure steps. In one or moreembodiments, the plasma comprises H₂, NO, N₂O, NF₃, Cl₂, Ar or N₂. Insome embodiments, the plasma changes the substrate surface by adding adifferent surface termination. For example, in embodiments where thesubstrate surface is exposed to a plasma comprising N₂O, the exposure tothe plasma is thought result in a —NO surface termination. While notwishing to be bound to any particular theory, it is thought that byadding such functionality, the substrate surface becomes more reactiveto certain reagents, particularly one or more of the pi acids and/orLewis bases described herein.

In some embodiments, exposure to the substrate surface comprisesexposing the substrate surface to a halide transfer agent. In one ormore embodiments, exposure of the substrate surface to the halidetransfer agent and any pi acid and/or Lewis base occurs sequentially orsubstantially sequentially As used herein, the phrase “exposure of thesubstrate surface to the halide transfer agent and the reagent occursubstantially sequentially” means that the substrate surface is exposedto the halide transfer agent with a majority of the halide transferagent exposure duration not coinciding with exposure to the reagent,although there may be some overlap. In some embodiments, exposure of thesubstrate surface to the halide transfer agent and any pi acid and/orLewis base occurs simultaneously or substantially simultaneously. Asused herein, “substantially simultaneously” means that the substratesurface is exposed to the halide transfer agent with a majority of thehalide transfer agent exposure duration coinciding with exposure to thereagent, although there may be some time where the two do not overlap.Again, while not wishing to be bound to any particular theory, it isthought that exposure of the substrate surface to a halide transferagent results in the substrate surface having halide surfaceterminations, thereby making it more reactive to one or more of the piacids and/or Lewis bases described herein. In some embodiments, thehalide transfer agent comprises a dihalide. In further embodiments, thedihalide comprises I₂, Br₂, Cl₂. In other embodiments, the halidetransfer agent comprises a trialkylsilyl halide or an alkyl halide,wherein the alkyl group(s) of either the trialkylsilyl halide or alkylhalide may be a C1-C6 alkyl group. Examples of suitable alkyl halidesinclude ethyliodide and diiodoethane.

In some embodiments, activation of the substrate surface comprisesexposing the substrate surface to an oxidizing environment. In one ormore embodiments, exposure of the substrate surface to the halidetransfer agent and any pi acid and/or Lewis base occurs sequentially orsubstantially sequentially. As used herein, the phrase “exposure of thesubstrate surface to the oxidizing environment and the reagent occursubstantially sequentially” means that the substrate surface is exposedto the oxidizing environment with a majority of the oxidizingenvironment exposure duration not coinciding with exposure to thereagent, although there may be some overlap. In one or more embodiments,exposure to an oxidizing environment comprises exposing the substratesurface to O₂, O₃, N₂O, NO, Br₂, F₂, I₂ or Cl₂.

In some embodiments, the reagent gas utilized after exposing thesubstrate to an oxidizing environment comprises one or more of CO, PR¹₃, N₂O, NO, NH₃, NR² ₃, wherein each R¹ is a C1-C6 alkyl group and eachR² is C1-C6 branched or unbranched, substituted or unsubstituted, alkyl,allyl or cyclic hydrocarbon or heteroatomic group. In other embodiments,the reagent gas comprises a chelating amine, such asN,N,N′N′-tetramethylethylene diamine and N,N′-dimethylethylenediamine.In other embodiments, the reagent gas utilized after exposing thesubstrate to an oxidizing surface comprises an aluminum-containingprecursor, such as chloroalkylaluminums, aluminum trihalides, aluminumhalide hydrides, alkyl aluminum hydride.

It should be noted that any of the above activation processes and/orreagents may be combined. That is, more than one activation process maybe utilized, or more than one reagent may be used during a given etchsequence. Furthermore, it is to be understood that the process may berepeated until the desired amount of transition metal has been etchedaway.

Selective Etch Process

One or more of the processes described herein may be utilized forselective etching. Accordingly, another aspect of the invention relatesto a method of etching a multi-layer substrate. The method comprisingproviding a multi-layer substrate comprising two or more of a layer ofCo, a layer of Cu and a layer of Ni; activating a surface of the layerof Co, layer of Cu or layer of Ni, wherein activation of the substratesurface comprises exposing the substrate surface to heat, a plasma or ahalide transfer agent to provide an activated substrate surface; andexposing the activated substrate surface to a chelating amine at a firsttemperature such that the chelating amine will only form a volatilemetal coordination complex with one of Co, Cu or Ni at the firsttemperature. As discussed above, in one or more embodiments, themulti-layer substrate may comprise another component selected from thegroup consisting of oxygen, boron, carbon, sulfur, nitrogen, andcombinations thereof.

Generally, this process can be used to etch one of Co, Cu or Ni at atime. That is, in one or more embodiments, Co can be removed withoutdisturbing Cu or Ni layers, Cu can be removed without disturbing Co orNi layers, and Ni can be removed without disturbing Co or Cu layers.Once one of these layers is removed, the temperature may be changed toremove a different metal. Thus, in some embodiments, the method furthercomprises exposing the activated substrate surface to a chelating amineat a second temperature, such that the chelating amine will only form avolatile metal coordination complex with one of Co, Cu or Ni at thesecond temperature.

In some embodiments, the chelating amine has a structure represented by:

wherein each R^(a) is independently H or C1-C4 alkyl, with the provisothat not all of the R^(a) groups are hydrogen. In one or moreembodiments, the chelating amine is selected from the group consistingof N,N,N′,N′-tetramethylethylene diamine andN,N′-dimethylethylenediamine.

While not wishing to be bound to any particular theory, it is thoughtthat Ni, Co and Cu form coordination metal complexes with the abovechelating amine with different volatilities at different temperatures.Thus, temperature may be controlled as a parameter to complex one metalat a time, while leaving the other two metals undisturbed. The specifictemperatures will depend on the specific metal and chelating aminesselected.

Exemplary Processes

Several processes will be exemplified below and in the figures. It is tobe understood that the structures shown are representative of thechemical mechanisms that are thought to be occurring during the etchprocess. However, they are not intended to be limiting, and otherchemical structures may occur.

FIG. 1 illustrates an exemplary process in accordance with one or moreembodiments of the invention. Specifically, a thermal etching processusing halide activation and a Lewis base is shown. First, a cobaltsubstrate surface is provided. The substrate surface is exposed to ahalide transfer agent. The halide transfer agent may be a dihalide or analkyl halide such as an ethyl halide. An exemplary process may utilizeBr₂ at a substrate temperature of at least about 200° C.

Once the substrate surface is exposed to the halide transfer agent, thesurface is modified with halide termination/surface functionality toprovide an activated substrate surface. Next, activated substratesurface is exposed to a Lewis base and/or pi acid. FIG. 1 is shown withN,N,N′,N′-tetramethylethylenediamine (TMEDA) or a tertiary amine or a COreagent. Once the activated substrate surface is exposed to the reagent,the reagent complexes a metal atom from the substrate surface. As shownin the process of FIG. 1, where TMEDA is utilized as the reagent, it maycomplex a cobalt atom, resulting in a metal coordination complex withthe cobalt coordinated to the N,N,N′,N′-tetramethylethylenediamine andtwo halide ligands. The formed cobalt complex may then be purged awayfrom the substrate surface, taking away at least one cobalt atom fromthe original substrate surface.

FIG. 2 illustrates a process similar to FIG. 1, but instead usesN,N′-dimethylethylenediamine and secondary amines, protonated versionsof TMEDA or tertiary amine respectively. A cobalt substrate surface isagain provided, and it is exposed to a halide transfer agent to providean activated surface. The activated substrate surface is exposed to theN,N′-dimethylethylenediamine or secondary amine reagent. The cobalthalide may act as a reactive handle to generate cobalt amides in ametathesis reaction. With these reagents, it is thought that thecomplexed cobalt will contain two N,N′-dimethylethylenediamine orsecondary amine ligands, at least one of which would form a covalentbond with the central metal atom. The other ligand is shown as forming adative bond. The process in FIG. 2 is shown having a hydrogen halidebyproduct. For example, where Br₂ is used, HBr would be formed as abyproduct. It is thought that a hydrogen halide byproduct would help toincrease the vapor pressure, so that the etch can be carried out at alower temperature.

FIG. 3 illustrates an etch process based on plasma activation. A cobaltsurface is again provided. The substrate surface is exposed with aplasma (shown as H₂), while simultaneously exposed to a Lewis base(shown as either CO or TMEDA). Once the activated substrate surface isexposed to the reagent, the reagent complexes a metal atom from thesubstrate surface. As shown in the process of FIG. 3, where CO isutilized as the reagent, it may complex a cobalt atom, resulting in ametal coordination complex with the cobalt coordinated to four COligands. The formed cobalt complex may then be purged away from thesubstrate surface, taking away at least one cobalt atom from theoriginal substrate surface.

FIG. 4 illustrates another etch process based on plasma activation. Inthis process, a cobalt substrate surface is exposed to a N₂O plasma. Theplasma activates the surface by creating —NO functionality. The reagent,CO, is then used to complex the cobalt, thought to result in a metalcoordination complex having the formula Co_(x)(CO)_(y)(NO)_(z). In oneor more embodiments, the complex may comprise a cobalt atom coordinatedto three CO ligands and one NO ligand, also known as tetracarbonylcobaltnitrosyl. Tetracarbonylcobalt nitrosyl is known to be quite volatileeven at room temperature, which would allow for etching at very lowtemperatures.

In some processes, the use of plasma provides sufficient energy topromote a species into the excited state where surface reactions becomefavorable and likely. Introducing the plasma into the process can becontinuous or pulsed. In some embodiments, sequential pulses ofprecursors (or reactive gases) and plasma are used to process a layer.In some embodiments, the reagents may be ionized either locally (i.e.,within the processing area) or remotely (i.e., outside the processingarea). In some embodiments, remote ionization can occur upstream of thedeposition chamber such that ions or other energetic or light emittingspecies are not in direct contact with the depositing film. In somePEALD processes, the plasma is generated external from the processingchamber, such as by a remote plasma generator system. The plasma may begenerated via any suitable plasma generation process or technique knownto those skilled in the art. For example, plasma may be generated by oneor more of a microwave (MW) frequency generator or a radio frequency(RF) generator. The frequency of the plasma may be tuned depending onthe specific reactive species being used. Suitable frequencies include,but are not limited to, 2 MHz, 13.56 MHz, 40 MHz, 60 MHz and 100 MHz.Although plasmas may be used during some of the processes disclosedherein, it should be noted that plasmas may not required.

One or more of the processes described herein include a purge. Thepurging process keeps the reagents separate. The substrate and chambermay be exposed to a purge step after stopping the flow of one or more ofthe reagents. A purge gas may be administered into the processingchamber with a flow rate within a range from about 10 sccm to about10,000 sccm, for example, from about 50 sccm to about 5,000 sccm, and ina specific example, about 1000 sccm. The purge step removes any excessprecursor, byproducts and other contaminants within the processingchamber. The purge step may be conducted for a time period within arange from about 0.1 seconds to about 60 seconds, for example, fromabout 1 second to about 10 seconds, and in a specific example, fromabout 5 seconds. The carrier gas, the purge gas, the deposition gas, orother process gas may contain nitrogen, hydrogen, argon, neon, helium,or combinations thereof. In one example, the carrier gas comprises argonand nitrogen.

According to one or more embodiments, the substrate is subjected toprocessing prior to and/or after forming etch. This processing can beperformed in the same chamber or in one or more separate processingchambers. In some embodiments, the substrate is moved from the firstchamber to a separate, second chamber for further processing. Thesubstrate can be moved directly from the first chamber to the separateprocessing chamber, or it can be moved from the first chamber to one ormore transfer chambers, and then moved to the desired separateprocessing chamber. Accordingly, the processing apparatus may comprisemultiple chambers in communication with a transfer station. An apparatusof this sort may be referred to as a “cluster tool” or “clusteredsystem”, and the like.

Generally, a cluster tool is a modular system comprising multiplechambers which perform various functions including substratecenter-finding and orientation, degassing, annealing, deposition and/oretching. According to one or more embodiments, a cluster tool includesat least a first chamber and a central transfer chamber. The centraltransfer chamber may house a robot that can shuttle substrates betweenand among processing chambers and load lock chambers. The transferchamber is typically maintained at a vacuum condition and provides anintermediate stage for shuttling substrates from one chamber to anotherand/or to a load lock chamber positioned at a front end of the clustertool. Two well-known cluster tools which may be adapted for the presentinvention are the Centura® and the Endura®, both available from AppliedMaterials, Inc., of Santa Clara, Calif. The details of one suchstaged-vacuum substrate processing apparatus is disclosed in U.S. Pat.No. 5,186,718, entitled “Staged-Vacuum Wafer Processing Apparatus andMethod,” Tepman et al., issued on Feb. 16, 1993. However, the exactarrangement and combination of chambers may be altered for purposes ofperforming specific steps of a process as described herein. Otherprocessing chambers which may be used include, but are not limited to,cyclical layer deposition (CLD), atomic layer deposition (ALD), chemicalvapor deposition (CVD), physical vapor deposition (PVD), other etch,pre-clean, chemical clean, thermal treatment such as RTP, plasmanitridation, degas, orientation, hydroxylation and other substrateprocesses. By carrying out processes in a chamber on a cluster tool,surface contamination of the substrate with atmospheric impurities canbe avoided without oxidation prior to depositing a subsequent film.

According to one or more embodiments, the substrate is continuouslyunder vacuum or “load lock” conditions, and is not exposed to ambientair when being moved from one chamber to the next. The transfer chambersare thus under vacuum and are “pumped down” under vacuum pressure. Inertgases may be present in the processing chambers or the transferchambers. In some embodiments, an inert gas is used as a purge gas toremove some or all of the reactants after forming the layer on thesurface of the substrate. According to one or more embodiments, a purgegas is injected at the exit of the chamber to prevent reactants frommoving from the chamber to the transfer chamber and/or additionalprocessing chamber. Thus, the flow of inert gas forms a curtain at theexit of the chamber.

The substrate can be processed in single substrate deposition chambers,where a single substrate is loaded, processed and unloaded beforeanother substrate is processed. The substrate can also be processed in acontinuous manner, like a conveyer system, in which multiple substrateare individually loaded into a first part of the chamber, move throughthe chamber and are unloaded from a second part of the chamber. Theshape of the chamber and associated conveyer system can form a straightpath or curved path. Additionally, the processing chamber may be acarousel in which multiple substrates are moved about a central axis andare exposed to deposition, etch, annealing, cleaning, etc. processesthroughout the carousel path.

During processing, the substrate can be heated or cooled. Such heatingor cooling can be accomplished by any suitable means including, but notlimited to, changing the temperature of the substrate support andflowing heated or cooled gases to the substrate surface. In someembodiments, the substrate support includes a heater/cooler which can becontrolled to change the substrate temperature conductively. In one ormore embodiments, the gases (either reactive gases or inert gases) beingemployed are heated or cooled to locally change the substratetemperature. In some embodiments, a heater/cooler is positioned withinthe chamber adjacent the substrate surface to convectively change thesubstrate temperature.

The substrate can also be stationary or rotated during processing. Arotating substrate can be rotated continuously or in discreet steps. Forexample, a substrate may be rotated throughout the entire process, orthe substrate can be rotated by a small amount between exposure todifferent reactive or purge gases. Rotating the substrate duringprocessing (either continuously or in steps) may help produce a moreuniform deposition or etch by minimizing the effect of, for example,local variability in gas flow geometries.

In atomic layer deposition-type chambers, the substrate can be exposedto the reagents and/or other compounds either spatially or temporallyseparated processes. Temporal ALD (or etch) is a traditional process inwhich the first precursor flows into the chamber to react with thesurface. The first precursor is purged from the chamber before flowingthe second precursor. In spatial ALD (or etch), both the first andsecond precursors are simultaneously flowed to the chamber but areseparated spatially so that there is a region between the flows thatprevents mixing of the precursors. In spatial ALD, the substrate must bemoved relative to the gas distribution plate, or vice-versa.

Reference throughout this specification to “one embodiment,” “certainembodiments,” “one or more embodiments” or “an embodiment” means that aparticular feature, structure, material, or characteristic described inconnection with the embodiment is included in at least one embodiment ofthe invention. Thus, the appearances of the phrases such as “in one ormore embodiments,” “in certain embodiments,” “in one embodiment” or “inan embodiment” in various places throughout this specification are notnecessarily referring to the same embodiment of the invention.Furthermore, the particular features, structures, materials, orcharacteristics may be combined in any suitable manner in one or moreembodiments.

Although the invention herein has been described with reference toparticular embodiments, it is to be understood that these embodimentsare merely illustrative of the principles and applications of thepresent invention. It will be apparent to those skilled in the art thatvarious modifications and variations can be made to the method andapparatus of the present invention without departing from the spirit andscope of the invention. Thus, it is intended that the present inventioninclude modifications and variations that are within the scope of theappended claims and their equivalents.

EXAMPLES Example 1 Cobalt Etch at 200-300° C.

An air-exposed cobalt coupon deposited via plasma vapor deposition (PVD)and having a thickness of 130 Angstroms was provided. The cobalt couponwas deposited over a silicon substrate. The cobalt coupon was exposed to0.1 seconds of a Br₂ pulse at temperatures between 200 and 300° C.,followed by a 4 second purge. The substrate surface was then exposed toa 1 second purge of N,N,N′,N′-tetramethylethylenediamine (TMEDA) attemperatures between 200 and 300° C., followed by another 4 secondpurge. A possible chemical mechanism of this process is shown in FIG. 5.

After 20 cycles of Br₂/TMEDA, all of the cobalt was removed from thecoupon, but the SiO₂ was undisturbed, as measured by X-Ray Fluorescencespectroscopy. FIG. 6 shows a graph of the cobalt etched in Angstroms asa function of cycles. As shown in the figure, an etch rate of about 7Angstroms of cobalt was removed per cycle, with a 2-cycle incubation. Noetch was observed with either the Br₂ or TMEDA pulses are absent,demonstrating that neither regent can etch by itself. This exampledemonstrates the effectiveness of the etch process, as the cobalt wascompletely removed without affecting the underlying SiO₂ substrate. Theprocess also demonstrated good etch control, with about 7 Angstroms ofcobalt being reliably removed per cycles.

Example 2 Cobalt Etch as a Function of Temperature

The etch process of Example 1 was repeated, but the substratetemperature during exposure to Br₂ and TMEDA was 150° C. A possiblechemical mechanism of this process is shown in FIG. 7. A roughening ofthe surface was observed, but very little change in terms of Co counts.It is thought that the reaction is occurring, but that the resulting Cocomplex is not volatile at 150° C. This demonstrates that thetemperature must be selected for the specific complexes formed to ensurethat the complex is volatile enough to be able to purge away from thesubstrate surface.

10 cycles of etch using the same process was measured at othertemperatures, the results of which are shown in FIG. 8. As seen in thegraph, amount of cobalt etched after 10 cycles remained fairlyconsistent after the temperature reached 200° C. This demonstrates thatthe etch rate is fairly consistent and independent of temperature oncetemperature is high enough so that the resulting cobalt complex isvolatile.

Example 3 Cobalt Etch as a Function of Purge Time

The etch process of Example 1 was repeated twice, but the substratetemperature during exposure to Br₂ and TMEDA was 200° C. and the purgetime was varied from 4 seconds to 2 minutes. FIG. 9 shows a graph of thecobalt etched in Angstroms versus the number of cycles for a process inwhich the purge time was 2 minutes and a process in which the purge timewas 4 seconds. The amount of cobalt etched was nearly identical for thetwo processes. This demonstrates that the length of purge time betweencycles does not appear to affect the etch rate of the process.

Example 4 Copper Etch Selectivity

A copper coupon deposited via PVD and having a thickness of 100-400Angstroms was provided. The copper coupon overlaid a tantalum layeroverlying a silicon substrate. The cobalt coupon was exposed to Br₂,followed by treatment with TMEDA at a temperature of 300° C. A possiblechemical mechanism of this process is shown in FIG. 10. After 10 cycles,all of the copper was removed from the coupon. After the copper wasremoved, a shiny silver was observed on the surface that immediatelyoxidized and peeled away from the substrate on exposure to air. Thisdemonstrates that the copper was completely removed, leaving theunderlying tantalum layer completely untouched, signifying that theprocess was selective for copper over tantalum.

What is claimed is:
 1. A method of etching a substrate, the method comprising: activating a substrate surface comprising a transition metal, wherein activation of the substrate surface comprises exposing the substrate surface to heat, a plasma, an oxidizing environment, or a halide transfer agent to provide an activated substrate surface; and exposing the activated substrate surface to a reagent comprising a Lewis base or pi acid to provide a vapor phase coordination complex comprising one or more atoms of the transition metal coordinated to one or more ligands from the reagent.
 2. The method of claim 1, wherein the Lewis base or pi acid comprises CO, PR¹ ₃, wherein each R¹ is independently a C1-C6 alkyl group, 1,2-bis(difluorophosphino)ethane, N₂O, NO, NH₃, NR² ₃, wherein each R² is independently hydrogen C1-C6 branched or unbranched, substituted or unsubstituted, alkyl, allyl or cyclic hydrocarbon or heteroatomic group, or a compound having the structure:

wherein each R^(b) is independently hydrogen, R or C1-C4 alkyl.
 3. The method of claim 1, wherein the pi acid comprises AlH_(n)X_(m)R^(c) _(p), wherein X is a halogen, the sum of n+m+p is 3, and R^(c) is C1-C6 alkyl.
 4. The method of claim 2, wherein the Lewis base or pi acid comprises a chelating amine selected from the group consisting of N,N,N′,N′-tetramethylethylene diamine, ethylene diamine, N,N′-dimethylethylenediamine, 2-(aminomethyl)pyridine, 2-[(alkylamino)methyl]pyridine, and 2-[(dialkylamino)methyl]pyridine, wherein the alkyl group is C1-C6 alkyl.
 5. The method of claim 1, wherein activation of the substrate surface comprises exposing the substrate surface to heat.
 6. The method of claim 5, wherein exposure of the substrate surface to heat and the reagent occur sequentially or substantially sequentially.
 7. The method of claim 1, wherein activation of the substrate surface comprises exposing the substrate surface to a plasma.
 8. The method of claim 7, wherein the plasma comprises H₂, NO, N₂O, NF₃, Cl₂, Ar or N₂.
 9. The method of claim 8, wherein the plasma comprises N₂O, and exposure of the substrate surface to the N₂O results in a —NO surface termination.
 10. The method of claim 1, wherein activation of the substrate surface comprises exposure to a halide transfer agent.
 11. The method of claim 1, wherein exposure of the substrate surface to an oxidizing environment comprises exposing the substrate surface to O₂, O₃, N₂O, NO, Br₂, F₂, I₂ or Cl₂.
 12. The method of claim 1, wherein the transition metal comprises an element selected from the group consisting of Co, Cu, Ru, Ni, Fe, Pt, Mn and Pd.
 13. The method of claim 1, wherein the substrate surface comprises about 90 to about 100% transition metal and 0 to about 10% carbon.
 14. The method of claim 1, wherein the substrate surface overlies a deposition chamber wall or showerhead.
 15. A method of etching a multi-layer substrate, the method comprising: providing a multi-layer substrate comprising two or more of a layer of Co, a layer of Cu and a layer of Ni; activating a surface of the layer of Co, layer of Cu or layer of Ni, wherein activation of the substrate surface comprises exposing the substrate surface to heat, a plasma or a halide transfer agent to provide an activated substrate surface; and exposing the activated substrate surface to a chelating amine at a first temperature such that the chelating amine will only form a volatile metal coordination complex with one of Co, Cu or Ni at the first temperature.
 16. The method of claim 15, further comprising exposing the activated substrate surface to a chelating amine at a second temperature, such that the chelating amine will only form a volatile metal coordination complex with one of Co, Cu or Ni at the second temperature.
 17. The method of claim 16, wherein the chelating amine has a structure represented by:

wherein each R^(a) is independently hydrogen or C1-C4 alkyl, with the proviso that not all of the R^(a) groups are hydrogen.
 18. The method of claim 17, wherein the chelating amine is selected from the group consisting of N,N,N′,N′-tetramethylethylene diamine and N,N′-dimethylethylenediamine.
 19. The method of claim 18, further comprising purging the coordination complex.
 20. A method of etching a substrate, the method comprising: activating a substrate surface comprising cobalt or copper, wherein activation of the substrate surface comprises exposing the substrate surface to Br₂ to provide an activated substrate surface; and exposing the activated substrate surface to a reagent comprising TMEDA to provide a vapor phase coordination complex comprising one or more atoms of the cobalt or copper coordinated to one or more ligands from the reagent. 